Structure and growth of strained Cu films on Ru(0001)

Surface Science

Volumn 447, Issue 1, 2000, Pages

  Zajonz, H ^a   Gibbs, D ^a   Baddorf, A P ^b   Jahns, V ^b   Zehner, D M ^b  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; DEPOSITION; EPITAXIAL GROWTH; FILM GROWTH; INTERFACES (MATERIALS); METALLIC FILMS; MONOLAYERS; MORPHOLOGY; SURFACE ROUGHNESS; X RAY DIFFRACTION; X RAY SCATTERING;

X-RAY REFLECTION;

RUTHENIUM;

EID: 0033900525     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)01222-4     Document Type: Article

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