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Surface Science

Volumn 367, Issue 3, 1996, Pages

Intramolecular features of individual C60 molecules on Si(100) observed by STM

(5) Yao, Xiaowei a Ruskell, Todd G a Workman, Richard K a Sarid, Dror a Chen, Dong b

a UNIVERSITY OF ARIZONA (United States)

b IBM (United States)

Author keywords

Chemisorption; Fullerenes; Physisorption; Scanning tunneling microscopy

Indexed keywords

ADSORPTION; ELECTRONIC DENSITY OF STATES; FULLERENES; SCANNING TUNNELING MICROSCOPY; SILICON;

INTRAMOLECULAR CHARACTERISTICS; SILICON SURFACE;

CHEMISORPTION;

EID: 0030392761 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(96)01090-4 Document Type: Article

Times cited : (26)

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