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Solid-State Electronics

Volumn 46, Issue 10, 2002, Pages 1651-1657

The problems originating from the grain boundaries in dielectric storage capacitors

(2) Lee, Jang Sik a Joo, Seung Ki a

a Seoul National University (South Korea)

Author keywords

Degradation; Ferroelectric random access memory; Grain boundary; Pb(Zr,Ti)O3; Selectively nucleated lateral crystallization; Thin film

Indexed keywords

CAPACITORS; CRYSTALLIZATION; DIELECTRIC MATERIALS; ELECTRODES; FATIGUE OF MATERIALS; GRAIN BOUNDARIES; LEAKAGE CURRENTS; POLARIZATION;

DIELECTRIC STORAGE CAPACITORS;

THIN FILMS;

EID: 0036779155 PISSN: 00381101 EISSN: None Source Type: Journal
DOI: 10.1016/S0038-1101(02)00120-X Document Type: Conference Paper

Times cited : (11)

References (20)

1
- 35348846979
- (1989) Science , vol.246 , pp. 1400
- Scott, J.F.¹ Paz de Araujo, C.A.²

2
- 0009956356
- Digest of Technical Papers
- (2000) IEEE International Solid-State Circuits Conference , vol.268
- Paz de Araujo, C.¹ McMillan, L.² Joshi, V.³ Solayappan, N.⁴ Lim, M.⁵ Arita, K.⁶ Moriwaki, N.⁷ Hirano, H.⁸ Baba, T.⁹ Shimada, Y.¹⁰ Sumi, T.¹¹ Fujii, E.¹² Otsuki, T.¹³

3
- 0033339694
- (1999) Integrated Ferroelectrics , vol.27 , pp. 257
- Hada, H.¹ Tanabe, N.² Amanuma, K.³ Tatsumi, T.⁴ Kobayashi, S.⁵ Kunio, T.⁶

4
- 0009953755
- Digest of Technical Papers
- (2000) 2000 Symposium on VLSI Technology , vol.34
- Jang, N.W.¹ Song, Y.J.² Kim, H.H.³ Jung, D.J.⁴ Koo, B.J.⁵ Lee, S.Y.⁶ Joo, S.H.⁷ Lee, K.M.⁸ Kim, K.⁹

5
- 0033645520
- (2000) Integrated Ferroelectrics , vol.28 , pp. 213
- Aggarwal, S.¹ Ganpule, C.² Jenkins, I.G.³ Nagaraj, B.⁴ Stanishevsky, A.⁵ Melngailis, J.⁶ Williams, E.⁷ Ramesh, R.⁸

6
- 0009935690
- Digest of Technical Papers
- (2000) 2000 Symposium on VLSI Technology , vol.32
- Itoh, A.¹ Hikosaka, Y.² Saito, T.³ Naganuma, H.⁴ Miyazawa, H.⁵ Ozaki, Y.⁶ Kato, Y.⁷ Mihara, S.⁸ Iwamoto, H.⁹ Mochizuki, S.¹⁰ Nakamura, M.¹¹ Yamazaki, T.¹²

7
- 0009953598
- Digest of Technical Papers
- (2000) 2000 IEEE International Solid-State Circuits Conference , vol.272
- Jeon, B.-G.¹ Choi, M.K.² Song, Y.³ Oh, S.-K.⁴ Chung, Y.⁵ Suh, K.-D.⁶ Kim, K.⁷

8
- 0000377815
- (1996) Appl Phys Lett , vol.69 , pp. 3188
- Kushida-Abdelghafar, K.¹ Miki, H.² Torii, K.³ Fujisaki, Y.⁴

9
- 0000192175
- (1997) Appl Phys Lett , vol.70 , pp. 3096
- Shimamoto, Y.¹ Kushida-Abdelghafar, K.² Miki, H.³ Fujisaki, Y.⁴

10
- 0001335770
- (1997) Appl Phys Lett , vol.71 , pp. 1267
- Han, J.-P.¹ Ma, T.P.²

11
- 0034315966
- (2000) Jpn J Appl Phys , vol.39 , pp. 6343
- Lee, J.-S.¹ Joo, S.-K.²

12
- 0000200977
- (1997) Appl Phys , vol.81 , pp. 2349
- Foster, C.M.¹ Bai, G.-R.² Csencsits, R.³ Vetrone, J.⁴ Jammy, R.⁵ Wills, L.A.⁶ Carr, E.⁷ Amano, J.⁸

13
- 0033734372
- (2000) Jpn J Appl Phys , vol.39 , pp. 1203
- Chung, S.-O.¹ Lee, H.-C.² Lee, W.-J.³

14
- 0020183118
- (1982) Appl Phys , vol.53 , pp. 6229
- Loh, E.J.¹

15
- 84963164011
- (1986) Ferroelectrics , vol.69 , pp. 179
- Neumann, H.¹ Arlt, G.²

16
- 0029223646
- In: Tuttle B.A., Desu S.M., Ramesh R., Shiosaki T., editors. Ferroelectric thin films IV., Boston, MA
- (1994) Mat. Res. Soc. Proc. , vol.361 , pp. 395-402
- Voigt, J.A.¹ Tuttle, B.A.² Headley, T.J.³ Lamppa, D.L.⁴

17
- 0023365893
- (1987) IEEE Trans Components, Hybrids, Manuf Technol , vol.CHMT-10 , Issue.2 , pp. 274
- Yoo, I.K.¹ Burton, L.C.² Stephenson, F.W.³

18
- 0027839708
- (1993) Integrated Ferroelectrics , vol.3 , pp. 365
- Desu, S.B.¹ Yoo, I.K.²

19
- 21544465649
- (1991) J Appl Phys , vol.70 , pp. 382
- Scott, J.F.¹ Araujo, C.A.² Melnick, B.M.³ McMillan, L.D.⁴ Zuleeg, R.⁵

20
- 0001289642
- (2000) J Appl Phys , vol.87 , pp. 2227
- Poonawala, N.¹ Dravid, V.P.² Auciello, O.³ Im, J.⁴ Krauss, A.R.⁵

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.