Measurement-based closed-form modeling of surface-mounted RF components

IEEE Transactions on Microwave Theory and Techniques

Volumn 50, Issue 10, 2002, Pages 2276-2286

  Naishadham, Krishna ^a,b,c   Durak, Tahsin ^d  

^a IEEE   (United States)

^b PHILIPS RESEARCH LABORATORIES   (Germany)

^c SYRACUSE RESEARCH CORPORATION   (United States)

^d Syracuse University   (United States)

Author keywords

CPW; Equivalent circuit modeling; Measurement based modeling; Microwave CAD; Network analyzer; Package and layout parasitic effects; RF component measurements; S parameters

Indexed keywords

LAYOUT PARASITIC EFFECTS; MEASUREMENT BASED CLOSED FORM MODELING; MICROWAVE COMPUTER AIDED DESIGN; PACKAGE PARASITIC EFFECTS; PASSIVE SURFACE MOUNTED DEVICES; SURFACE MOUNTED RESONANT FREQUENCY COMPONENTS;

CAPACITORS; COMPUTER AIDED DESIGN; ELECTRIC INDUCTORS; EQUIVALENT CIRCUITS; NATURAL FREQUENCIES; OPTIMIZATION; SCATTERING PARAMETERS; SEMICONDUCTOR DEVICE MODELS; SURFACE MOUNT TECHNOLOGY; WAVEGUIDES;

MICROWAVE MEASUREMENT;

EID: 0036772720     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2002.803431     Document Type: Article

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