Analysis of reverse current-voltage characteristics of Schottky diodes based on phonon-assisted tunneling including Frenkel emission mechanism

Solid-State Electronics

Volumn 46, Issue 9, 2002, Pages 1283-1287

  Pipinys, P ^a   Rimeika, A ^a   Pipiniene, A ^a  

^a VYTAUTAS MAGNUS UNIVERSITY   (Lithuania)

Author keywords

Frenkel emission; Phonon assisted tunneling; Schottky diodes

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC FIELD EFFECTS; ELECTRON TUNNELING; INTERFACES (MATERIALS); LEAKAGE CURRENTS; PHONONS; SEMICONDUCTOR JUNCTIONS; THIN FILM TRANSISTORS;

FRENKEL EMISSIONS;

SCHOTTKY BARRIER DIODES;

EID: 0036721828     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00070-9     Document Type: Article

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