BSIMPD: a partial-depletion SOI MOSFET model for deep-submicron CMOS designs

Proceedings of the Custom Integrated Circuits Conference

Volumn , Issue , 2000, Pages 197-200

  Su, Pin ^a   Fung, Samuel K H ^a   Tang, Stephen ^a   Assaderaghi, Fariborz ^a   Hu, Chenming ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; IMPACT IONIZATION; INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS; MOSFET DEVICES; SILICON ON INSULATOR TECHNOLOGY;

IMPACT IONIZATION CURRENT; PARTIALLY DEPLETED SILICON ON INSULATOR TECHNOLOGIES; SOFTWARE PACKAGE BSIM3V3; SOFTWARE PACKAGE SPICE;

SEMICONDUCTOR DEVICE MODELS;

EID: 0033698080     PISSN: 08865930     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)