Investigation of the effects of polishing and etching on the quality of Cd1-xZnxTe using spatial mapping techniques

Journal of Electronic Materials

Volumn 26, Issue 6, 1997, Pages 529-533

  Yoon, H ^a   Van Scyoc, J M ^a   Goorsky, M S ^a   Hermon, H ^b   Schieber, M ^b   Lund, J C ^b   James, R B ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

Alpha particle mapping; Cadmium zinc telluride; Etching; High resolution x ray diffraction; Polishing; Radiation detectors

Indexed keywords

EID: 0004571607     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-997-0189-2     Document Type: Article

References (17)

1. F.P. Doty, J.F. Butler, J.F. Schetzina and K.A. Bowers, J. Vac. Sci. Technol. B 10, 1418 (1992).
2. J.F. Butler, C.L. Lingren and F.P. Doty, IEEE Trans. Nucl. Sci. 39, 605 (1992).
3. Semiconductors for Room-Temperature Radiation Detector Applications, eds. R.B. James, T.E. Schlesinger, P. Siffert and L. Franks, 302 (Pittsburgh, PA: Mater. Res. Soc., 1993).
4. Semiconductors for Room Temperature Nuclear Detector Applications, eds. T.E. Schlesinger and R.B. James, (San Diego: Academic Press, 1995), p. 43.
5. V.S. Wang and R.J. Matyi, J. Appl. Phys. 72, 5158 (1992).
6. L. Hart, D.K. Bowen and G.R. Fisher,Adv. X-ray Analysis 33, 55 (1990).
7. C.J. Johnson, E.E. Eissler, S.E. Cameron, Y. Kong, S. Fan, S. Jovanovic and K.G. Lynn, Semiconductors for Room-Temperature Radiation Detector Applications, eds. R.B. James, T.E. Schlesinger, P. Siffert and L. Franks, 302 (Pittsburgh, PA: Mater. Res. Soc., 1993), p. 463.
8. H. Chen, J. Tong, Z. Hu, D.T. Shi, G.H. Wu, K.-T. Chen, M.A. George, W.E. Collins, A. Burger, R.B. James, C.M. Stahle and L.M. Barlett, J. Appl. Phys. 80, 3509 (1996).
9. H. Chen, S.U. Egarievwe, Z. Hu, J. Tong, D.T. Shi, G.H. Wu, K.-T. Chen, M.A. George, W.E. Collins, A. Burger, R.B. James, C.M. Stahle and L.M. Bartlett, Hard X-ray/Gamma Ray and Neutron Optics, Sensors, and Applications, eds. R.B. Hoover and F.P. Doty, 2859 (SPIE, 1996).
10. J.M. Van Scyoc, J.C. Lund, D.H. Morse, A.J. Antolak, R.W. Olsen, R.B. James, M. Schieber, H. Yoon, M.S. Goorsky, J. Toney and T.E. Schlesinger, J. Electron. Mater. 25, 1323 (1996).
11. J. M. Van Scyoc, H. Yoon, M. S. Goorsky, J. C. Lund, R. B. James and F. P. Doty, presented at the 1996 IEEE Nuclear Science Symp., Anaheim, CA.
12. H. Chen, S.U. Egarievwe, Z. Hu, J. Tong, D.T. Shi, G.H. Wu, K.-T. Chen, M.A. George, W.E. Collins, A. Burger, R.B. James, C.M. Stahle, and L.M. Bartlett, Hard X-ray/Gamma Ray and Neutron Optics, Sensors, and Applications, eds. R.B. Hoover and F.P. Doty, 2859 (SPIE,1996).
13. A. Musa and J.P. Ponpon, Nucl. Instr. Meth. 216, 259 (1983).
14. M.S. Goorsky, H. Yoon, M. Schieber, R.B. James, D.S. McGregor and M. Natarajan, presented at the 9th Intl. Workshop on Room-Temperature Semiconductor X- and γ-ray Detectors, Associated Electronics, and Applications, September 1995, Grenoble, France, to appear in Nucl. Instr. and Meth. A.
15. H. Yoon, S.E. Lindo and M.S. Goorsky, presented at the ACCG-10/ICVGE-9 Conference, Vail, CO, August 1996 and accepted for publication in the J. Cryst. Growth.
16. H. Yoon, J.M. Van Scyoc, M.S. Goorsky, J.C. Lund, M. Schieber, R.B. James and F.P. Doty, presented at the Electronic Materials Conf., Santa Barbara, CA, June 26-28, 1996.
17. J.F. Butler, F.P. Doty, B. Apotovsky, J. Lajzerowicz and L. Verger, Mater. Sci. and Eng. B 16, 291 (1993).