Thermal analysis of thin-film vertical-cavity surface-emitting lasers using finite element method

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 8, 2002, Pages 5181-5186

  Ouchi, Toshihiko ^a  

^a CANON INC   (Japan)

Author keywords

Epitaxial layer transfer; Finite element method; Hybrid integration; Optical interconnections; Thermal resistance; Thin film device; Vertical cavity surface emitting lasers

Indexed keywords

FINITE ELEMENT METHOD; HEAT RESISTANCE; INTEGRATED OPTOELECTRONICS; OPTICAL INTERCONNECTS; STRUCTURAL DESIGN; SUBSTRATES; THERMAL CONDUCTIVITY; THERMOANALYSIS; THIN FILM DEVICES;

VERTICAL-CAVITY SURFACE-EMITTING LASERS (VCSEL);

SEMICONDUCTOR LASERS;

EID: 0036697476     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.5181     Document Type: Article

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