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Journal of the American Ceramic Society

Volumn 85, Issue 8, 2002, Pages 1997-2000

In-plane polarized 0.7Pb(Mg1/3Nb2/3)O3-0.3PbTiO3 thin films

(4) Zhou, Qifa a Zhang, Qingqi a Xu, Baomin a,b Trolier McKinstry, Susan a,b

a PENNSYLVANIA STATE UNIVERSITY (United States)

b PALO ALTO RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; ELECTRODEPOSITION; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROELECTROMECHANICAL DEVICES; PEROVSKITE; RAPID THERMAL ANNEALING; SCANNING ELECTRON MICROSCOPY; SOL-GELS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

PYROELECTRIC IMAGING;

THIN FILMS;

EID: 0036686018 PISSN: 00027820 EISSN: None Source Type: Journal
DOI: 10.1111/j.1151-2916.2002.tb00394.x Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.