Relaxor Pb(Mg1/3Nb2/3)O3thin films and their electromechanical properties

Integrated Ferroelectrics

Volumn 25, Issue 1-4, 1999, Pages 125-133

  Kighelman, Zian ^a   Damjanovic, Dragan ^a   Seifert, Andreas ^a   Hiboux, Stephane ^a   Sagalowicz, Laurent ^a   Setter, Nava ^a  

^a EPFL   (Switzerland)

Author keywords

Chemical solution deposition; Piezoelectricity; PMN; Relaxor; Seeding layers; Thin films

Indexed keywords

CRYSTAL MICROSTRUCTURE; DIELECTRIC PROPERTIES OF SOLIDS; DIELECTRIC RELAXATION; ELECTRIC FIELD MEASUREMENT; ELECTROSTRICTION; FERROELECTRICITY; PERMITTIVITY MEASUREMENT; PIEZOELECTRICITY; SEMICONDUCTING LEAD COMPOUNDS; THERMAL EFFECTS;

ALKOXIDE SOLUTION PRECURSORS; DIELECTRIC PERMITTIVITY; ELECTROMECHANICAL PROPERTIES; RELAXOR; SEEDING LAYERS;

THIN FILMS;

EID: 0033314674     PISSN: 10584587     EISSN: None     Source Type: Journal    
DOI: 10.1080/10584589908210166     Document Type: Article

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