Digital hilbert transformation for separation measurement of thicknesses and refractive indices of layered objects by use of a wavelength-scanning heterodyne interference confocal microscope

Applied Optics

Volumn 41, Issue 22, 2002, Pages 4497-4502

  Watanabe, Yuuki ^a   Yamaguchi, Ichirou ^a  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEMODULATION; DIGITAL SIGNAL PROCESSING; HETERODYNING; PHASE LOCKED LOOPS; RADIO INTERFERENCE; SCANNING; SPURIOUS SIGNAL NOISE;

OPTICAL PATH DIFFERENCE (OPD);

REFRACTIVE INDEX;

EID: 0036683830     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.41.004497     Document Type: Article

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