Geometrical cross-sectional imaging by a heterodyne wavelength-scanning interference confocal microscope

Optics Letters

Volumn 25, Issue 8, 2000, Pages 548-550

  Fukano, Takashi ^a   Yamaguchi, Ichirou ^b  

^a SAITAMA UNIVERSITY   (Japan)

^b RIKEN   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

THREE-DIMENSIONAL IMAGING;

HETERODYNING; IMAGING TECHNIQUES; INTERFEROMETERS; MODULATION; REFRACTIVE INDEX; SEMICONDUCTOR LASERS;

OPTICAL MICROSCOPY;

EID: 0000162684     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.25.000548     Document Type: Article

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