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Volumn 46, Issue 8, 2002, Pages 1185-1192
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New "silicon limit" of power devices
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Author keywords
CB structure; COOLMOST; Hexagonal cell; On resistance; Super junction devices
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Indexed keywords
COMPUTER SIMULATION;
DOPING (ADDITIVES);
ELECTRIC BREAKDOWN;
ELECTRIC RESISTANCE;
SEMICONDUCTING SILICON;
SUPER-JUNCTION DEVICES;
POWER ELECTRONICS;
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EID: 0036680245
PISSN: 00381101
EISSN: None
Source Type: Journal
DOI: 10.1016/S0038-1101(02)00010-2 Document Type: Article |
Times cited : (7)
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References (11)
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