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Volumn 50, Issue 7, 2002, Pages 1665-1674

Conductivity measurements at the interface between the sintered conductor and dielectric substrate at microwave frequencies

Author keywords

Complex permittivity; Dielectric rod resonator; Glass ceramic substrate; Interface conductivity; Microwave measurement; Sapphire; Sintered copper

Indexed keywords

COPPER; DIELECTRIC MATERIALS; ELECTRIC CONDUCTIVITY; ELECTRIC CONDUCTIVITY MEASUREMENT; FREQUENCIES; GLASS CERAMICS; INTERFACES (MATERIALS); PERMITTIVITY; RESONATORS; SAPPHIRE; SINTERING; SUBSTRATES;

EID: 0036646969     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2002.800382     Document Type: Article
Times cited : (21)

References (13)
  • 1
    • 0009873112 scopus 로고
    • Complex permittivity measurement of dielectric plates by a cavity resonance method
    • IEICE, Tokyo, Japan, Nov.
    • (1988) IEICE Tech. Rep. , vol.MW88-40 , pp. 43-50
    • Kobayashi, Y.1    Sato, J.2
  • 2
    • 0024027992 scopus 로고
    • Improved cavity resonance method for nondestructive measurement of complex permittivity of dielectric plate
    • (1988) CPEM Dig. , pp. 147-148
  • 5
    • 0028448778 scopus 로고
    • A measurement method of complex permittivity at pseudo micro wave frequency using a cavity resonator filled with dielectric material
    • June
    • (1994) IEICE Trans. Electron. , vol.E77-C , Issue.6 , pp. 894-899
    • Nakayama, A.1
  • 13
    • 0009871232 scopus 로고    scopus 로고
    • Development of material for multilayer ceramic substrate with copper wiring in millimeter wave applications
    • Apr.
    • (2000) IEMT/IMC Symp. , pp. 382-385
    • Terashi, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.