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Volumn 50, Issue 7, 2002, Pages 1665-1674
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Conductivity measurements at the interface between the sintered conductor and dielectric substrate at microwave frequencies
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Author keywords
Complex permittivity; Dielectric rod resonator; Glass ceramic substrate; Interface conductivity; Microwave measurement; Sapphire; Sintered copper
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Indexed keywords
COPPER;
DIELECTRIC MATERIALS;
ELECTRIC CONDUCTIVITY;
ELECTRIC CONDUCTIVITY MEASUREMENT;
FREQUENCIES;
GLASS CERAMICS;
INTERFACES (MATERIALS);
PERMITTIVITY;
RESONATORS;
SAPPHIRE;
SINTERING;
SUBSTRATES;
DIELECTRIC SUBSTRATES;
MICROWAVE MEASUREMENT;
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EID: 0036646969
PISSN: 00189480
EISSN: None
Source Type: Journal
DOI: 10.1109/TMTT.2002.800382 Document Type: Article |
Times cited : (21)
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References (13)
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