An interconnect energy model considering coupling effects

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 21, Issue 7, 2002, Pages 763-776

  Uchino, Taku ^b   Cong, Jason ^a,c  

^a IEEE   (United States)

^b Toshiba America Inc   (United States)

^c Los Angeles   (United States)

Author keywords

Coupling effects; Interconnect energy model; Power estimation

Indexed keywords

CHARGE TIME; COUPLING EFFECTS; ELMORE DELAY; INTERCONNECT ENERGY MODEL; POWER ESTIMATION; STABILITY ANALYSIS;

ALGORITHMS; COMPUTATIONAL COMPLEXITY; COMPUTER AIDED DESIGN; CORRELATION METHODS; COUPLED CIRCUITS; CROSSTALK; DELAY CIRCUITS; ERROR ANALYSIS; ESTIMATION; MATHEMATICAL MODELS; SPURIOUS SIGNAL NOISE;

INTEGRATED CIRCUIT LAYOUT;

EID: 0036638793     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2002.1013890     Document Type: Article

References (13)

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6. An interconnect energy model considering coupling effects
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