Transmission electron microscopy investigation of boron- doped polycrystalline chemically vapour-deposited diamond

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 82, Issue 9, 2002, Pages 1741-1768

  Steeds, J W ^a   Mora, A E ^a   Butler, J E ^b   Bussmann, K M ^b  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BORON; CHEMICAL VAPOR DEPOSITION; CRYSTAL DEFECTS; CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; SCANNING ELECTRON MICROSCOPY; STRESSES; TRANSMISSION ELECTRON MICROSCOPY;

DIFFRACTION CONTRAST TECHNIQUES; ELONGATED GRAIN CLUSTERS; EQUIAXED GRAIN CLUSTERS; NANOTWINS;

SYNTHETIC DIAMONDS;

EID: 0036625522     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418610208235687     Document Type: Article

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