Extended and point defects in diamond studied with the aid of various forms of microscopy

Microscopy and Microanalysis

Volumn 6, Issue 4, 2000, Pages 285-290

  Steeds, John W ^a   Charles, Steven J ^a   Gilmore, Annette C ^a   Butler, James E ^b  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Diamond; Grain boundaries; Impurities; Photoluminescence microscopy; Raman microscopy; Scanned ion beam mass spectrometry (SIMS); Self interstitials; Stress measurement; Transmission electron microscopy; Vacancies

Indexed keywords

EID: 0011742907     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S143192760200051X     Document Type: Article

References (15)

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