On the nature of extended defects in CVD diamond and the origin of compressive stresses

Diamond and Related Materials

Volumn 7, Issue 10, 1998, Pages 1437-1450

  Steeds, J W ^a   Gilmore, A ^a   Wilson, J A ^a   Butler, J E ^b  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b NAVAL RESEARCH LABORATORY   (United States)

Author keywords

CVD diamond; Defects; Stress; Transmission electron microscopy

Indexed keywords

CHEMICAL VAPOR DEPOSITION; COMPRESSIVE STRESS; CRYSTAL DEFECTS; CRYSTAL GROWTH; ELECTRON ENERGY LOSS SPECTROSCOPY; RAMAN SPECTROSCOPY; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

DIFFRACTION CONTRAST TRANSMISSION ELECTRON MICROSCOPY; OPEN FACED TETRAHEDRAL DEFECTS;

DIAMOND FILMS;

DIAMOND;

EID: 0032194797     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(98)00212-X     Document Type: Article

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