Instrumentation for noise measurements on CMOS transistors for fast detector preamplifiers

IEEE Transactions on Nuclear Science

Volumn 49 II, Issue 3, 2002, Pages 1281-1286

  Manghisoni, M ^a   Ratti, L ^b   Re, V ^a   Speziali, V ^b  

^a UNIVERSITY OF BERGAMO   (Italy)

^b UNIVERSITY OF PAVIA   (Italy)

Author keywords

CMOS; Deep submicron; Front end electronics; Noise

Indexed keywords

AMPLIFIERS (ELECTRONIC); BANDWIDTH; BIPOLAR TRANSISTORS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; FREQUENCY RESPONSE; GAMMA RAYS; MICROWAVE INTEGRATED CIRCUITS; RADIATION DETECTORS; READOUT SYSTEMS; WHITE NOISE; X RAYS;

FRONT-END ELECTRONICS; MICROWAVE BIPOLAR TRANSISTORS; SOFTWARE PACKAGE SPICE;

FIELD EFFECT TRANSISTORS;

EID: 0036624583     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.1039652     Document Type: Article

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