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Volumn 191, Issue 2, 2002, Pages 427-434
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Kelvin probing technique: A promising method for the determination of the yield strain of a solid under different types of stress
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Author keywords
[No Author keywords available]
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Indexed keywords
ELASTIC MODULI;
FERMI LEVEL;
INTERFEROMETRY;
LOADS (FORCES);
MICROELECTROMECHANICAL DEVICES;
PLASTIC DEFORMATION;
STRESSES;
TENSILE TESTING;
THIN FILMS;
KELVIN PROBING TECHNIQUE;
STRAIN;
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EID: 0036611459
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-396X(200206)191:2<427::AID-PSSA427>3.0.CO;2-H Document Type: Article |
Times cited : (23)
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References (26)
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