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Volumn 191, Issue 2, 2002, Pages 427-434

Kelvin probing technique: A promising method for the determination of the yield strain of a solid under different types of stress

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC MODULI; FERMI LEVEL; INTERFEROMETRY; LOADS (FORCES); MICROELECTROMECHANICAL DEVICES; PLASTIC DEFORMATION; STRESSES; TENSILE TESTING; THIN FILMS;

EID: 0036611459     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200206)191:2<427::AID-PSSA427>3.0.CO;2-H     Document Type: Article
Times cited : (23)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.