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Physica Status Solidi (A) Applied Research

Volumn 191, Issue 2, 2002, Pages 605-612

Spectroscopic ellipsometry of BaxSr1-xTiO3 thin films prepared by the sol-gel method

(6) Yang, Sheng Hong a Mo, Dang b Tian, Hu Yong c Luo, Wei Gen c Pu, Xing Hua c Ding, Ai Li c

a FUDAN UNIVERSITY (China)

b SUN YAT SEN UNIVERSITY (China)

c INSTITUTE OF GEOLOGY AND GEOPHYSICS (China)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; ELLIPSOMETRY; ENERGY GAP; SILICON; SOL-GELS; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS; STOICHIOMETRY; SUBSTRATES; ULTRAVIOLET RADIATION; X RAY DIFFRACTION ANALYSIS;

FILM COMPOSITION;

THIN FILMS;

EID: 0036611436 PISSN: 00318965 EISSN: None Source Type: Journal
DOI: 10.1002/1521-396X(200206)191:2<605::AID-PSSA605>3.0.CO;2-P Document Type: Article

Times cited : (5)

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