A study of barium strontium titanate thin films for use in bypass capacitors

Journal of Materials Research

Volumn 13, Issue 1, 1998, Pages 197-204

  Baumert, B A ^a   Chang, L H ^a   Matsuda, A T ^a   Tracy, C J ^a   Cave, N G ^a   Gregory, R B ^a   Fejes, P L ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; CAPACITORS; COATING TECHNIQUES; CRYSTALLIZATION; DECOMPOSITION; LEAKAGE CURRENTS; PERMITTIVITY; RAMAN SPECTROSCOPY; REACTION KINETICS; THERMOGRAVIMETRIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

BARIUM STRONTIUM TITANATE; BYPASS CAPACITOR; ELECTRICAL CHARACTERIZATION; PHYSICAL CHARACTERIZATION; SPIN COATING;

THIN FILMS;

EID: 0031650631     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1998.0026     Document Type: Article

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