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Optical Engineering

Volumn 41, Issue 5, 2002, Pages 994-1001

Principal Mueller matrix of reflection and scattering measured for a one-dimensional rough surface

(2) Nee, Soe Mie F a Nee, Tsu Wei a

a NAVAL AIR WARFARE CENTER (United States)

Author keywords

Depolarization; Ellipsometry; Mueller matrix; Polarization; Reflection; Rough surface; Scattering

Indexed keywords

LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT SCATTERING; MATHEMATICAL MODELS; ROUGHNESS MEASUREMENT; STAINLESS STEEL; SURFACE ROUGHNESS;

BECKMANN SCATTERING THEORY; BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION; CROSS-POLARIZED DEPOLARIZATION; FRESNEL EQUATIONS; MUELLER MATRIX; OFF-SPECULAR ANGLE; ROOT MEAN SQUARE ROUGHNESS;

ELLIPSOMETRY;

EID: 0036576914 PISSN: 00913286 EISSN: None Source Type: Journal
DOI: 10.1117/1.1467359 Document Type: Article

Times cited : (26)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.