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Journal of Micromechanics and Microengineering

Volumn 12, Issue 3, 2002, Pages 323-327

Residual stress-loaded titanium-nickel shape-memory alloy thin-film micro-actuators

(3) Wang, Rong Xin a Zohar, Yitshak a Wong, Man a

a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC RESISTANCE; HYSTERESIS; MICROACTUATORS; RESIDUAL STRESSES; SHAPE MEMORY EFFECT; THERMAL CONDUCTIVITY; THERMAL CYCLING; TITANIUM ALLOYS;

HYSTERESIS LOOPS;

THIN FILMS;

EID: 0036572999 PISSN: 09601317 EISSN: None Source Type: Journal
DOI: 10.1088/0960-1317/12/3/319 Document Type: Article

Times cited : (34)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.