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Volumn 45, Issue 5, 2002, Pages 67-72
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Device scaling drives pattern effect solutions
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COATINGS;
HEAT TRANSFER;
LITHOGRAPHY;
PROCESS CONTROL;
RADIATION EFFECTS;
SEMICONDUCTOR DEVICE MANUFACTURE;
THERMOOXIDATION;
THIN FILMS;
PATTERN EFFECTS;
RAPID THERMAL ANNEALING;
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EID: 0036570827
PISSN: 0038111X
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (20)
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References (14)
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