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Volumn 45, Issue 5, 2002, Pages 67-72

Device scaling drives pattern effect solutions

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; HEAT TRANSFER; LITHOGRAPHY; PROCESS CONTROL; RADIATION EFFECTS; SEMICONDUCTOR DEVICE MANUFACTURE; THERMOOXIDATION; THIN FILMS;

EID: 0036570827     PISSN: 0038111X     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (20)

References (14)
  • 6
    • 0030105421 scopus 로고    scopus 로고
    • The effect of multilayer patterns on temperature uniformity during rapid thermal processing
    • (1996) J. Electrochem. Soc. , vol.143 , pp. 1142


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.