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Volumn 190, Issue 1-4, 2002, Pages 728-731

In situ diffusion measurements during RBS analysis of polymers coated with aluminium

Author keywords

Diffusion; Metal plasma immersion ion implantation and deposition; Polymers; Rutherford backscattering spectroscopy

Indexed keywords

DIFFUSION; HIGH ENERGY PHYSICS; ION IMPLANTATION; IONS; LOW TEMPERATURE EFFECTS; METALLIZING; NUCLEAR INSTRUMENTATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THICKNESS MEASUREMENT;

EID: 0036570104     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)00448-2     Document Type: Conference Paper
Times cited : (3)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.