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Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films

Volumn 20, Issue 3, 2002, Pages 1082-1086

Sensitivity of x-ray photoconductors: Charge trapping and absorption-limited universal sensitivity curves

(2) Zahangir Kabir, M a Kasap, S O a

a UNIVERSITY OF SASKATCHEWAN (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRIC FIELDS; ELECTRONS; ENERGY ABSORPTION; HOLE TRAPS; NUMERICAL METHODS; PHOTOCURRENTS; X RAYS;

CHARGE TRAPPING; ELECTRON CONCENTRATION; ELECTRON DISTRIBUTION; HOLE PAIRS; X-RAY SENSITIVITY;

PHOTOCONDUCTING MATERIALS;

EID: 0036565367 PISSN: 07342101 EISSN: None Source Type: Journal
DOI: 10.1116/1.1460900 Document Type: Article

Times cited : (36)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.