Generalized image method with application to the thermal modeling of power devices and circuits

IEEE Transactions on Electron Devices

Volumn 49, Issue 4, 2002, Pages 679-686

  Rinaldi, Niccolò ^a,b  

^a IEEE   (Italy)

^b UNIVERSITY OF NAPLES FEDERICO II   (Italy)

Author keywords

Electrothermal effects; Semiconductor device modeling; Temperature

Indexed keywords

ELECTROTHERMAL EFFECTS; THERMAL MODELING;

ELECTRIC CONDUCTIVITY; ELECTROSTATICS; GEOMETRY; HEAT RESISTANCE; INFRARED IMAGING; INTEGRATED CIRCUITS; LAPLACE TRANSFORMS; THERMAL EFFECTS;

SEMICONDUCTOR DEVICE MODELS;

EID: 0036539622     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.992879     Document Type: Article

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