A new setup for elastic recoil analysis using ion induced electron emission for particle identification

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 136-138, Issue , 1998, Pages 695-700

  Steinbauer, E ^a   Benka, O ^a   Steinbatz, M ^a  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ATOMS; COMPUTATIONAL METHODS; HYDROGEN; IONS; PARTICLE ACCELERATORS; PARTICLE DETECTORS; SILICON;

DUAL PARAMETER MULTICHANNEL ANALYZERS; ELASTIC RECOIL DETECTION ANALYSIS (ERDA); MICROCHANNEL PLATES;

ELECTRON EMISSION;

EID: 0032020995     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(97)00781-7     Document Type: Article

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