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Solid State Phenomena

Volumn 63-64, Issue , 1998, Pages 115-122

LBIC investigations of the lifetime degradation by extended defects in multicrystalline solar silicon

(3) Rinio, M a Moller H J a Werner, M b

a TU BERGAKADEMIE FREIBERG (Germany)

b MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

Author keywords

Dislocation; EFG; LBIC; Recombination; Reflection measurement; RGS; Solar cell

Indexed keywords

DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; INDUCED CURRENTS; QUANTUM EFFICIENCY; SHORT CIRCUIT CURRENTS; SILICA; SILICON CARBIDE; SILICON WAFERS; TRANSMISSION ELECTRON MICROSCOPY;

LIGHT BEAM INDUCED CURRENT (LBIC) METHODS; RECOMBINATION CENTERS;

SILICON SOLAR CELLS;

EID: 0032311618 PISSN: 10120394 EISSN: None Source Type: Book Series
DOI: 10.4028/www.scientific.net/ssp.63-64.115 Document Type: Article

Times cited : (26)

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