Sampling clock jitter effects in digital-to-analog converters

Measurement: Journal of the International Measurement Confederation

Volumn 31, Issue 3, 2002, Pages 187-199

  Kurosawa, Naoki ^a   Kobayashi, Haruo ^a   Kogure, Hideyuki ^a   Komuro, Takanori ^b   Sakayori, Hiroshi ^b  

^a GUNMA UNIVERSITY   (Japan)

^b YOKOGAWA ANALYTICAL SYSTEMS INC   (Japan)

Author keywords

Analog circuit; DAC; Jitter; Sampling; Spread spectrum

Indexed keywords

COMPUTER SIMULATION; JITTER; LOW PASS FILTERS; SAMPLING; SIGNAL TO NOISE RATIO; SPECTRUM ANALYSIS; SPREAD SPECTRUM COMMUNICATION; SPURIOUS SIGNAL NOISE;

ANALOG CIRCUITS;

DIGITAL TO ANALOG CONVERSION;

EID: 0036532963     PISSN: 02632241     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0263-2241(01)00028-8     Document Type: Article

References (13)

1. ADC standard and testing in Japanese industr
2. Aperture jitter effects on wideband sampling systems
3. Finite aperture time and sampling jitter effects in wideband data acquisition systems
4. Analysis of accumulated timing-jitter in the time domain
5. Jitter analysis of high-speed sampling systems
6. The measurement and deconvolution of time jitter in equivalent-time waveform samplers
7. A general theory of phase noise in electrical oscillators
8. A study of phase noise in CMOS oscillators
9. Digital-to-analog (D/A) converters with nonuniformly sampled signals
10. Direct digital synthesizer with jittered clock
11. Explicit analysis of channel mismatch effects in time-interleaved ADC systems