Aperture jitter effects in wideband sampling systems

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 1999, Pages 880-885

  Kobayashi, Haruo ^a   Morimura, Masanao ^a   Kobayashi, Kensuke ^a   Onaya, Yoshitaka ^a  

^a GUNMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODE RAY OSCILLOSCOPES; SIGNAL TO NOISE RATIO;

APERTURE JITTER; WIDEBAND SAMPLING SYSTEMS;

SIGNAL NOISE MEASUREMENT;

EID: 0032652742     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)