Determination of the optimal burn-in time and cost using an environmental stress approach: A case study in switch mode rectifier

Reliability Engineering and System Safety

Volumn 76, Issue 1, 2002, Pages 53-61

  Wu, Cheng Lin ^a   Su, Chao Ton ^b  

^a MINGHSIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Accelerated factor; Accelerated stress test; Burn in; Stress burn in; Switch mode rectifier

Indexed keywords

ELECTRIC RECTIFIERS; FAILURE (MECHANICAL); FAILURE ANALYSIS; MACHINE COMPONENTS; STRESS ANALYSIS; THERMAL STRESS;

ENVIRONMENTAL STRESS SCREENING (ESS);

SYSTEMS ANALYSIS;

EID: 0036531197     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(01)00142-9     Document Type: Article

References (20)

1. A two-level ESS model: A mixed distribution approach
2. Optimal stress screening strategies for multi-component systems sold under warranty: The case of phase-type lifetimes
3. Effect of burn-in on mean residual life
4. Some economic problems related to burn-in programs
5. Components vs. system burn-in techniques for electronic equipment
6. Determining optimum burn-in and replacement time using Bayesian decision theory
7. Optimal burn-in time to minimize cost for products sold under warranty
8. A cost optimization model for determining optimal burn-in times at the module/system level of an electronic product
9. Reliability enhancement through optimal burn-in
10. ESS quantification for complex systems
11. Modeling and maximizing burn-in effectiveness
12. Anonparametric approach to estimate system burn-in time
13. Cost optimization of accelerate burn-in
14. Environment stress screening strategies for complex systems: A-3 level mixed distribution model
15. Economic cost modeling of environmental-stress-screening and burn-in
16. Economic design of high stress first burn-in processes
17. Warranty policies and burn-in