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Volumn 36, Issue 1, 1998, Pages 181-196

Economic design of high stress first burn-in processes

Author keywords

[No Author keywords available]

Indexed keywords

COSTS; DEFECTS; MANUFACTURE; MATERIALS; MATHEMATICAL MODELS;

EID: 0031699035     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/002075498193994     Document Type: Article
Times cited : (5)

References (29)
  • 4
    • 0009353629 scopus 로고
    • Optimal policies for burn-in procedures
    • Chandrasekaban, R., 1977, Optimal policies for burn-in procedures. Opsearch, 14 (3), 149-160.
    • (1977) Opsearch , vol.14 , Issue.3 , pp. 149-160
    • Chandrasekaban, R.1
  • 5
    • 0005357807 scopus 로고
    • Simulating burn-in strategies for highly integrated circuits
    • Chien, K., and Kuo, W., 1992, Simulating burn-in strategies for highly integrated circuits. IIE Transactions, 24 (5), 33-43.
    • (1992) IIE Transactions , vol.24 , Issue.5 , pp. 33-43
    • Chien, K.1    Kuo, W.2
  • 6
    • 0029277597 scopus 로고
    • Modeling and maximizing burn-in effectiveness
    • Chien, K., and Kuo, W., 1995, Modeling and maximizing burn-in effectiveness. IEEE Transactions on Reliability, 44 (1), 19-25.
    • (1995) IEEE Transactions on Reliability , vol.44 , Issue.1 , pp. 19-25
    • Chien, K.1    Kuo, W.2
  • 7
    • 3342932187 scopus 로고
    • The optimal burn-in testing of repairable equipment
    • Cozzolino, J. M., 1970, The optimal burn-in testing of repairable equipment. Naval Research Logistics Quarterly, 17 (2), 167-181.
    • (1970) Naval Research Logistics Quarterly , vol.17 , Issue.2 , pp. 167-181
    • Cozzolino, J.M.1
  • 11
    • 0021443115 scopus 로고
    • Reliability enhancement through optimal burn-in
    • Kuo, W., 1984, Reliability enhancement through optimal burn-in. IEEE Transactions on Reliability, R-33 (2), 145-156.
    • (1984) IEEE Transactions on Reliability , vol.R-33 , Issue.2 , pp. 145-156
    • Kuo, W.1
  • 12
    • 0020848561 scopus 로고
    • Facing the headaches of early failures: A state-of-the-art review of burn-in decisions
    • Kuo, W., and Kuo, Y., 1983, Facing the headaches of early failures: a state-of-the-art review of burn-in decisions. Proceedings of the IEEE, 71 (11), 1257-1266.
    • (1983) Proceedings of the IEEE , vol.71 , Issue.11 , pp. 1257-1266
    • Kuo, W.1    Kuo, Y.2
  • 13
    • 0019187796 scopus 로고
    • Memory burn-in with test
    • Philadelphia, PA
    • Lawrence, J. D., 1980, Memory burn-in with test. Proceedings of Test Conference, Philadelphia, PA, pp. 489-493.
    • (1980) Proceedings of Test Conference , pp. 489-493
    • Lawrence, J.D.1
  • 14
    • 0025446549 scopus 로고
    • Burn-in models and methods: A review
    • Leemis, L. M., and Beneke, M., 1990, Burn-in models and methods: a review. IIE Transactions, 22 (2), 172-180.
    • (1990) IIE Transactions , vol.22 , Issue.2 , pp. 172-180
    • Leemis, L.M.1    Beneke, M.2
  • 15
    • 0020734526 scopus 로고
    • Optimum simple step-stress plans for accelerated life testing
    • Miller, R., and Nelson, W., 1983, Optimum simple step-stress plans for accelerated life testing. IEEE Transactions on Reliability, R-32, 59-65.
    • (1983) IEEE Transactions on Reliability , vol.R-32 , pp. 59-65
    • Miller, R.1    Nelson, W.2
  • 17
    • 0020176422 scopus 로고
    • Optimal burn-in time to minimize cost for products sold under warranty
    • Nguyen, D. G., and Mubthy, D. N. P., 1982, Optimal burn-in time to minimize cost for products sold under warranty. IIE Transactions, 14 (3), 167-174.
    • (1982) IIE Transactions , vol.14 , Issue.3 , pp. 167-174
    • Nguyen, D.G.1    Mubthy, D.N.P.2
  • 18
    • 3342959757 scopus 로고
    • Run-in or ‘burn-in’ of electronic parts: A comprehensive, quantitative basis for choice of temperature, stress and duration
    • Norris, R. H., 1963, ‘Run-in’ or ‘burn-in’ of electronic parts: a comprehensive, quantitative basis for choice of temperature, stress and duration. Proceedings of the 9th National Symposium on Reliability and Quality Control, pp. 335-357.
    • (1963) Proceedings of the 9Th National Symposium on Reliability and Quality Control , pp. 335-357
    • Norris, R.H.1
  • 19
    • 0022231899 scopus 로고
    • Effect of burn-in on mean residual life
    • Park, K. S., 1985, Effect of burn-in on mean residual life. IEEE Transactions on Reliability, R-35 (5), 522-523.
    • (1985) IEEE Transactions on Reliability , vol.R-35 , Issue.5 , pp. 522-523
    • Park, K.S.1
  • 23
    • 0015382453 scopus 로고
    • Determining optimum burn-in and replacement times using Bayesian decision theory
    • Stewart, L., and Johnson, J. D., 1972, Determining optimum burn-in and replacement times using Bayesian decision theory. IEEE Transactions on Reliability, R-21 (3), 170-175.
    • (1972) IEEE Transactions on Reliability , vol.R-21 , Issue.3 , pp. 170-175
    • Stewart, L.1    Johnson, J.D.2
  • 24
    • 0028465892 scopus 로고
    • Design of a screening procedure: A review
    • Tang, K., and Tang, j., 1994, Design of a screening procedure: a review. Journal of Quality Technology, 26 (3), 209-226.
    • (1994) Journal of Quality Technology , vol.26 , Issue.3 , pp. 209-226
    • Tang, K.1    Tang, J.2
  • 25
    • 0025492234 scopus 로고
    • Shake and bake the bugs out. Quality Progress
    • Tusin, W., 1990, Shake and bake the bugs out. Quality Progress, September, pp. 61-64.
    • (1990) September , pp. 61-64
    • Tusin, W.1
  • 26
    • 0014879162 scopus 로고
    • Determination of optimal burn-in time: A composite criterion
    • Washburn, L., 1970, Determination of optimal burn-in time: a composite criterion. IEEE Transactions on Reliability, R-19 (4), 134-140.
    • (1970) IEEE Transactions on Reliability , vol.R-19 , Issue.4 , pp. 134-140
    • Washburn, L.1
  • 27
    • 0007640240 scopus 로고
    • On the possibility of improving the mean useful life of items by eliminating those with short lives
    • Watson, G. S., and Wells, W. T., 1961, On the possibility of improving the mean useful life of items by eliminating those with short lives. Technometrics, 3 (2), 281-298.
    • (1961) Technometrics , vol.3 , Issue.2 , pp. 281-298
    • Watson, G.S.1    Wells, W.T.2
  • 28
    • 0015107930 scopus 로고
    • Some economic problems related to burn-in programs
    • Weiss, G. H., and Dishon, M., 1971, Some economic problems related to burn-in programs. IEEE Transactions on Reliability, R-20 (3), 190-195.
    • (1971) IEEE Transactions on Reliability , vol.R-20 , Issue.3 , pp. 190-195
    • Weiss, G.H.1    Dishon, M.2
  • 29
    • 0024684641 scopus 로고
    • Components vs system burn-in techniques for electronic equipment
    • Whitbeck, C. W., and Leemis, L. M., 1989, Components vs system burn-in techniques for electronic equipment. IEEE Transactions on Reliability, R-38, 206-209.
    • (1989) IEEE Transactions on Reliability , vol.R-38 , pp. 206-209
    • Whitbeck, C.W.1    Leemis, L.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.