Cost optimization of accelerated burn-in

International Journal of Quality and Reliability Management

Volumn 13, Issue 7, 1996, Pages 69-78

  Hui, Y V ^a   Lu, W L ^a  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Cost improvement; Product quality; Reliability; Tests

Indexed keywords

EID: 0006243968     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656719610128574     Document Type: Article

References (16)

1. Kuo, W., Kuo, Y. (1983), "Facing the headaches of early failures: a state-of-the-art review of burn-in decisions" in Proceedings of the IEEE, pp. 1257-66.
2. Zacks, S. (1983), "Survey of classical and Bayesian approaches to the change-point problem" in Rizvi, M.H., Rustagi, S. and Siegmund, S. (Eds.), Recent Advances in Statistics, Academic Press, New York, NY, pp. 245-69.
3. Chou, K., Tang, K. (1992), "Burn-in time and estimation of change-point with Weibull-exponential distribution" in Decision Sciences, Vol. 23, pp. 973-90.
4. Lawrence, M.J. (1966), "An investigation of the burn-in problem" in Technometrics, Vol. 8, No. 1, pp. 61-71.
5. Chandrasekaran, R. (1977), "Optimal policies for burn-in procedures" in OPSEARCH, Vol. 4, pp. 149-60.
6. Park, K.S. (1985), "Effect of burn-in on mean residual life" in IEEE Transactions on Reliability, Vol. 34, No. 5, pp. 522-3.
7. Whitebeck, C.W., Leemis, L.M. (1989), "Component vs system burn-in techniques for electronic equipment" in IEEE Transactions on Reliability, Vol. 38, No. 2, pp. 206-09.
8. Fox, B. (1964), "Total annual cost, a reliability criterion" in Proceedings of the National Symposium on Reliability and Quality Control, pp. 266-73.
9. Plesser, K.T., Fied, T.O. (1977), "Cost-optimized burn-in duration for repairable electronic systems" in IEEE Transactions on Reliability, Vol. 26, No. 3, pp. 195-7.
10. Nguyen, D.G., Murthy, D.N.P. (1982), "Optimal burn-in time to minimize cost for products sold under warranty" in IIE Transactions, Vol. 14, No. 3, pp. 167-74.
11. Kuo, W. (1984), "Reliability enhancement through optimal burn-in" in IEEE Transactions on Reliability, Vol. 40, No. 2, pp. 145-56.
12. Jensen, F., Petersen, N.E. (1982), Burn-in: An Engineering Approach to the Design and Analysis of Burn-in Processes, John Wiley & Sons, New York, NY.
13. Tusin, W., "Shake and bake the bugs out" in Quality Progress, September 1990, pp. 61-4.
14. Tang, K., Tang, J. (1994), "Design of a screening procedure: a review" in Journal of Quality Technology, Vol. 26, No. 3, pp. 209-26.
15. Nelson, W. (1971), "Analysis of accelerated life test data - part I. The Arrhenius model and graphical methods" in IEEE Transactions on Electrical Insulation, Vol. 6, pp. 165-81.
16. Nelson, W. (1990), Accelerated Testing, John Wiley & Sons, New York, NY.