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Volumn 48, Issue 2-3, 2002, Pages 177-181

Sample refinement and manipulation of silicon nanowires: A step towards single wire characterization

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DEFECTS; ELECTRODES; ELECTROPHORESIS; ETCHING; NANOSTRUCTURED MATERIALS; REFINING; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036526519     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(02)00233-4     Document Type: Conference Paper
Times cited : (3)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.