|
Volumn 48, Issue 2-3, 2002, Pages 177-181
|
Sample refinement and manipulation of silicon nanowires: A step towards single wire characterization
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CHARACTERIZATION;
DEFECTS;
ELECTRODES;
ELECTROPHORESIS;
ETCHING;
NANOSTRUCTURED MATERIALS;
REFINING;
SILICON;
TRANSMISSION ELECTRON MICROSCOPY;
NANOWIRES;
WIRE;
|
EID: 0036526519
PISSN: 10445803
EISSN: None
Source Type: Journal
DOI: 10.1016/S1044-5803(02)00233-4 Document Type: Conference Paper |
Times cited : (3)
|
References (11)
|