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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 3 A, 2002, Pages 1293-1299

Characterization of extrinsic hysteresis phenomena of series-connected identical Esaki-diode-like negative differential resistance devices

(1) Gan, Kwang Jow a

a KUN SHAN UNIVERSITY (Taiwan)

Author keywords

Extrinsic hysteresis phenomena; NDR devices; Piecewise linear approximation

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; HYSTERESIS; PIECEWISE LINEAR TECHNIQUES;

ESAKI DIODES; EXTRINSIC HYSTERESIS; NEGATIVE DIFFERENTIAL RESISTANCE DEVICES;

SEMICONDUCTOR DEVICES;

EID: 0036509047 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.41.1293 Document Type: Article

Times cited : (3)

References (18)

1
- 0026103955
- (1991) IEEE J. Solid-State Circuits , vol.26 , pp. 145
- Kuo, T.H.¹ Lin, H.C.² Potter, R.C.³ Shupe, D.⁴

2
- 0026903981
- (1992) IEEE J. Solid-State Circuits , vol.27 , pp. 1198
- Yan, Z.X.¹ Deen, M.J.²

3
- 0030150179
- (1996) IEEE Electron Device Lett. , vol.17 , pp. 223
- Waho, T.¹ Chen, K.J.² Yamamoto, M.³

4
- 0030211846
- (1996) IEEE J. Solid-State Circuits , vol.31 , pp. 1151
- Chart, H.L.¹ Mohan, S.² Mazumder, P.³ Hadder, G.I.⁴

5
- 0032028977
- (1998) IEEE Electron Device Lett. , vol.19 , pp. 80
- Maezawa, K.¹ Matsuzaki, H.² Yamamoto, M.³ Otsuji, T.⁴

6
- 0031701561
- (1998) IEEE Electron Device Lett. , vol.19 , pp. 7
- Van der Wagt, J.P.A.¹ Seabaugh, A.C.² Beam, E.A.³

7
- 0035247969
- (2001) IEEE J. Solid-State Circuits , vol.36 , pp. 281
- Sano, K.¹ Murata, K.² Otsuji, T.³ Akeyoshi, T.⁴ Shimizu, N.⁵ Sano, E.⁶

8
- 0023436796
- (1987) IEEE Trans. Electron Devices , vol.34 , pp. 2185
- Sen, S.¹ Capasso, F.² Cho, A.Y.³ Sivco, D.⁴

9
- 0024750508
- (1989) IEEE Trans. Electron Devices , vol.36 , pp. 2065
- Capasso, F.¹ Sen, S.² Beltram, F.³ Lunardi, L.M.⁴ Vengurlekar, A.S.⁵ Smith, P.R.⁶ Shah, N.J.⁷ Malik, R.J.⁸ Cho, A.Y.⁹

10
- 0009750517
- (1989) Appl. Phys. Lett. , vol.55 , pp. 1871
- Wolak, E.¹ Park, B.G.² Lear, K.L.³ Harris J.S., Jr.⁴

11
- 0031142483
- (1997) J. Appl. Phys. , vol.81 , pp. 6825
- Gan, K.J.¹ Su, Y.K.² Wang, R.L.³

12
- 0031337471
- (1997) Solid-State Electron. , vol.41 , pp. 1917
- Gan, K.J.¹ Su, Y.K.²

13
- 0031246603
- (1997) Jpn. J. Appl. Phys. , vol.36 , pp. 6280
- Gan, K.J.¹ Su, Y.K.²

14
- 0000444814
- (1997) J. Appl. Phys. , vol.82 , pp. 5822
- Gan, K.J.¹ Su, Y.K.²

15
- 0009680275
- (1998) Solid-State Electron. , vol.42 , pp. 176
- Gan, K.J.¹ Su, Y.K.² Wang, R.L.³

16
- 0001605765
- (1965) IEEE Trans. Circuit Theory , vol.12 , pp. 433
- Nagata, M.¹

17
- 0020735720
- (1983) Int. J. Circuit Theory Appl. , vol.11 , pp. 161
- Chua, L.O.¹ Yu, J.² Yu, Y.³

18
- 0000583143
- (1995) IEEE Trans. CAD Integrat. Circuits & Syst. , vol.14 , pp. 653
- Mohan, S.¹ Sun, J.P.² Mazumder, P.³ Hadder, G.I.⁴

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