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Volumn 11, Issue 3-6, 2002, Pages 1193-1199

Morphology and characterization of highly nitrogenated, aligned, amorphous carbon nano-rods formed on an alumina template by ECR-CVD

(4) Liu, X W a Lin, J H a Hsieh, W J a Shih, H C a

a NATIONAL TSING HUA UNIVERSITY (Taiwan)

Author keywords

A C:N nano rods; Electron cyclotron resonance chemical vapor deposition (ECR CVD); Highly nitrogenated amorphous carbon nitride; Transmission electron microscopy (TEM)

Indexed keywords

ALUMINA; AMORPHOUS MATERIALS; CHEMICAL VAPOR DEPOSITION; ELECTRON CYCLOTRON RESONANCE; FLUXES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAPHITE; MORPHOLOGY; NITROGEN; POROUS MATERIALS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

CARBON NANORODS; NITROGENATION;

CARBON NANOTUBES;

VAPOR DEPOSITION;

EID: 0036508399 PISSN: 09259635 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-9635(01)00660-4 Document Type: Article

Times cited : (8)

References (36)

1
- 0000092194
- (1985) Phys. Rev. B , vol.32 , pp. 7988
- Cohen, M.L.¹

2
- 20444373328
- (1989) Science , vol.245 , pp. 841
- Liu, A.Y.¹ Cohen, M.L.²

3
- 0042059097
- (1990) Phys. Rev. B , vol.41 , pp. 10727
- Liu, A.Y.¹ Cohen, M.L.²

4
- 0009606403
- San Diego, CA, 30 April-4 May 2001, HP-1-3
- (2001) Proceedings of the International Conference on Metallurgical Coatings and Thin Films ICMCTF
- Liu, X.W.¹ Jong, W.J.² Lai, S.H.³ Shih, H.C.⁴

5
- 0009642990
- 2-6 October 2000
- (2000) Proceedings of the American Vacuum Society 47th International Symposium
- Liu, X.W.¹ Huang, K.P.² Lin, J.H.³ Chao, L.T.⁴ Lin, P.⁵ Shih, H.C.⁶

6
- 0034205906
- (2000) Appl. Surf. Sci , vol.159 , pp. 341
- Aono, M.¹ Nitta, S.² Katsuno, T.³ Iuchi, T.⁴ Nonomura, S.⁵

7
- 0001519427
- (1999) Appl. Phys. Lett , vol.74 , pp. 197
- Sung, S.L.¹ Tsai, S.H.² Tseng, C.H.³ Liu, X.W.⁴ Shih, H.C.⁵

8
- 0034142461
- (2000) J. Mater. Res , vol.15 , Issue.2 , pp. 502
- Sung, S.L.¹ Tsai, S.H.² Liu, X.W.³ Shih, H.C.⁴

9
- 0032687103
- (1999) Thin Solid Films , vol.340 , pp. 169
- Sung, S.L.¹ Tseng, C.H.² Guo, X.J.³ Chiang, F.K.⁴ Liu, X.W.⁵ Shih, H.C.⁶

10
- 0033704232
- (2000) Mater. Lett , vol.44 , pp. 304
- Liu, X.W.¹ Lin, J.H.² Chao, L.T.³ Shih, H.C.⁴

11
- 26444594415
- (2000) J. Vac. Sci. Technol. B , vol.18 , pp. 1840
- Liu, X.W.¹ Tsai, S.H.² Lee, L.C.³

12
- 0031572023
- (1997) Appl. Phys. Lett , vol.71 , pp. 1477
- Silva, S.R.P.¹ Amaratunga, G.A.J.² Barnes, J.R.³

13
- 0038552612
- (1997) Appl. Phys. Lett , vol.71 , pp. 2253
- Groning, O.¹ Kuttel, O.M.² Groning, P.³ Schlapbach, L.⁴

14
- 0035148712
- (2001) Surf. Coat. Technol , vol.135 , pp. 184
- Liu, X.W.¹ Tseng, C.H.² Lin, J.H.³ Shih, H.C.⁴

15
- 0035500527
- (2001) Mater. Chem. Phys , vol.72 , Issue.2 , pp. 258
- Liu, X.W.¹ Lin, J.H.² Tseng, C.H.³ Shih, H.C.⁴

16
- 0034188178
- (2000) Thin Solid Films , vol.366 , pp. 11
- Tsai, S.H.¹ Chiang, F.K.² Tsai, T.G.³ Shieu, F.S.⁴ Shih, H.C.⁵

17
- 0033871309
- (2000) J. Mater. Sci. Lett , vol.19 , pp. 671
- Chiang, F.K.¹ Tsai, S.H.² Shieu, F.S.³ Shih, H.C.⁴

18
- 0001561246
- (2000) Carbon , vol.38 , pp. 1879
- Tsai, S.H.¹ Shiu, C.T.² Jong, W.J.³ Shih, H.C.⁴

19
- 0001066512
- (1999) Appl. Phys. Lett , vol.74 , pp. 3462
- Tsai, S.H.¹ Chao, C.W.² Lee, C.L.³ Shih, H.C.⁴

20
- 0000915372
- (2000) Carbon , vol.38 , pp. 775
- Tsai, S.H.¹ Lee, C.L.² Chao, C.W.³ Shih, H.C.⁴

21
- 0032637983
- (1999) J. Electrochem. Soc , vol.2 , Issue.5 , pp. 247
- Tsai, S.H.¹ Chao, C.W.² Lee, C.L.³ Liu, X.W.⁴ Lin, I.N.⁵ Shih, H.C.⁶

22
- 0000344849
- (1996) Chem. Mater , vol.8 , pp. 2041
- Wong, E.W.¹ Maynor, B.W.² Burns, L.D.³ Lieber, C.M.⁴

23
- 0032026217
- (1998) Adv. Mater , vol.10 , pp. 398
- Heilmann, A.¹ Jutzi, P.² Klipp, A.³

24
- 0027907813
- (1993) Science , vol.261 , pp. 1316
- Whitney, T.M.¹ Jiang, J.S.² Searson, P.C.³ Chien, C.L.⁴

25
- 0032495928
- (1998) Chem. Phys. Lett , vol.287 , pp. 671
- Sen, R.¹ Satishkumar, B.C.² Govindaraj, A.³

26
- 0000229103
- (1999) Chem. Phys. Lett , vol.300 , pp. 695
- Suenaga, K.¹ Johansson, M.P.² Hellgren, N.³

27
- 0031141783
- (1997) Solid-State Commun , vol.102 , pp. 605
- Miyamoto, Y.¹ Cohen, M.L.² Louie, S.G.³

28
- 85045611239
- (1998) Carbon , vol.36 , pp. 731
- Belt, T.¹ Bauger, A.² Find, J.³

29
- 0000143094
- (1997) J. Mater. Chem , vol.7 , Issue.12 , pp. 2335
- Sen, R.¹ Satishkumar, B.C.² Govindaraj, A.³ Harikumar, K.R.⁴ Renganathan, H.K.⁵ Rao, C.N.R.⁶

30
- 9644257884
- (1998) Adv. Mater , vol.11 , pp. 655
- Terrones, M.¹ Redlich, P.² Grobert, N.³

31
- 0342945364
- (1995) Phys. Rev. Lett , vol.75 , pp. 1336
- Sjostrom, H.¹ Stafstrom, S.² Boman, M.³ Sundgren, J.E.⁴

32
- 0005656995
- (1998) Appl. Phys. Lett , vol.72 , pp. 1173
- Jessensky, O.¹ Müller, F.² Gele, U.³

33
- 0031186143
- (1997) Thin Solid Films , vol.304 , pp. 183
- Taki, Y.¹ Kitagawa, T.² Takai, O.³

34
- 0003447441
- Academic Press Inc
- (1991) The Handbook of Infrared and Raman Characteristic Frequencies of Organic Molecules
- Vien, D.L.¹ Colthup, N.B.² Fateley, W.G.³ Grasselli, J.G.⁴

35
- 4243363393
- (1984) Phys. Rev. B , vol.30 , pp. 870
- Beeman, D.¹ Silverman, J.² Lynds, R.³ Anderson, M.R.⁴

36
- 12044253618
- (1994) Phys. Rev. Lett , vol.73 , pp. 118
- Marton, D.¹ Boyd, K.J.² Al-Bayati, A.H.³ Todorov, S.S.⁴ Rabalais, J.W.⁵

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