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Volumn 20, Issue 2, 2002, Pages 613-617
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Optimum B+ implantation conditions for the edge termination of the Au/n-Si Schottky diodes
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Author keywords
[No Author keywords available]
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Indexed keywords
BORON;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC BREAKDOWN;
ELECTRIC FIELDS;
LEAKAGE CURRENTS;
SCHOTTKY BARRIER DIODES;
EDGE TERMINATION;
ION IMPLANTATION;
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EID: 0036505039
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1458953 Document Type: Article |
Times cited : (4)
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References (16)
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