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Volumn 20, Issue 2, 2002, Pages 613-617

Optimum B+ implantation conditions for the edge termination of the Au/n-Si Schottky diodes

Author keywords

[No Author keywords available]

Indexed keywords

BORON; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN; ELECTRIC FIELDS; LEAKAGE CURRENTS; SCHOTTKY BARRIER DIODES;

EID: 0036505039     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1458953     Document Type: Article
Times cited : (4)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.