|
Volumn 49, Issue 3, 2002, Pages 414-421
|
Analysis on high-frequency characteristics of SOI lateral BJTs with self-aligned external base for 2-GHz RF applications
|
Author keywords
Bipolar transistors; Semiconductor device fabrication; Silicon on insulator (SOI) technology
|
Indexed keywords
CROSSTALK;
OPTIMIZATION;
OSCILLATIONS;
POLYSILICON;
SILICON ON INSULATOR TECHNOLOGY;
OSCILLATION FREQUENCY;
BIPOLAR TRANSISTORS;
|
EID: 0036494452
PISSN: 00189383
EISSN: None
Source Type: Journal
DOI: 10.1109/16.987111 Document Type: Article |
Times cited : (5)
|
References (21)
|