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Volumn 49, Issue 3, 2002, Pages 414-421

Analysis on high-frequency characteristics of SOI lateral BJTs with self-aligned external base for 2-GHz RF applications

Author keywords

Bipolar transistors; Semiconductor device fabrication; Silicon on insulator (SOI) technology

Indexed keywords

CROSSTALK; OPTIMIZATION; OSCILLATIONS; POLYSILICON; SILICON ON INSULATOR TECHNOLOGY;

EID: 0036494452     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.987111     Document Type: Article
Times cited : (5)

References (21)
  • 17
    • 0028518480 scopus 로고
    • Sidewall effects on maximum cutoff frequency and forward transit time in downscaled bipolar transistors
    • (1994) Solid State Electron. , vol.37 , Issue.10 , pp. 1731-1737
    • Rinaldi, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.