A CPW T-resonator technique for electrical characterization of microwave substrates

IEEE Microwave and Wireless Components Letters

Volumn 12, Issue 3, 2002, Pages 90-92

  Peterson, Rebecca Lorenz ^a,b,c   Drayton, Rhonda Franklin ^a,b  

^a IEEE   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

^c Princeton University   (United States)

Author keywords

Coplanar waveguide; Dielectric constant; Resonators; Semiconductor material measurements

Indexed keywords

MICROWAVE SUBSTRATES;

ATTENUATION; ELECTRIC IMPEDANCE; PERMITTIVITY; SEMICONDUCTING SILICON; SUBSTRATES; WAVEGUIDES;

RESONATORS;

EID: 0036493347     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/7260.989861     Document Type: Article

References (8)

1. Microwave properties of ceramic materials
2. Tests characterize high-frequency material properties
3. Coplanar waveguides on silicon substrate with thick oxidized porous silicon (OPS) layer
4. Dielectric properties of oxidized porous silicon in a low resistivity substrate
5. High resolution coplanar structures on multilayer LTCC for applications up to 40 GHz
6. A multiline method of network analyzer calibration