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Volumn 5, Issue 1, 2002, Pages 11-15

Structure of ZnO films prepared by oxidation of metallic zinc

Author keywords

Film texture; Oxidation; ZnO

Indexed keywords

ELECTROOPTICAL EFFECTS; EVAPORATION; GLASS; IMPURITIES; MICROSTRUCTURE; OXIDATION; PIEZOELECTRICITY; SUBSTRATES; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

EID: 0036486150     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1369-8001(02)00050-1     Document Type: Article
Times cited : (43)

References (8)
  • 6
    • 0022705722 scopus 로고
    • A study of the effect of technological parameters of R.F. sputtering on the size of grains and the texture of the ZnO films
    • (1986) Thin Solid Films , vol.138 , pp. 111
    • Krzesinski, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.