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Applied Physics A: Materials Science and Processing

Volumn 74, Issue 2, 2002, Pages 253-256

Infrared picosecond absorption spectroscopy of microcrystalline silicon: Separation between carrier recombination in crystalline and amorphous fractions

(5) Kudrna, J a Pelant, I b Stepanek J a Trojanek F a Maly P a

a CHARLES UNIVERSITY (Czech Republic)

b INSTITUTE OF PHYSICS (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS MATERIALS; COMPOSITION; CRYSTALLINE MATERIALS; GLOW DISCHARGES; HYDROGENATION; INFRARED SPECTROSCOPY; MATHEMATICAL MODELS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; THICKNESS MEASUREMENT; VOLUME FRACTION;

INFRARED PICOSECOND ABSORPTION SPECTROSCOPY; MICROCRYSTALLINE SILICON; SILICON TETRAHYDRITE; ULTRAFAST CARRIER DYNAMICS;

SILICON;

EID: 0036477487 PISSN: 09478396 EISSN: None Source Type: Journal
DOI: 10.1007/s003390100886 Document Type: Article

Times cited : (1)

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