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Physical Review B - Condensed Matter and Materials Physics

Volumn 65, Issue 5, 2002, Pages 544221-544226

Determining the interfacial barrier height and its relation to tunnel magnetoresistance

(3) Rottlander P a Hehn, M a Schuhl, A a

a CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM OXIDE; TANTALUM; TANTALUM OXIDE; UNCLASSIFIED DRUG;

ARTICLE; ELECTRIC CURRENT; ELECTRIC POTENTIAL; ELECTRODE; MAGNETISM; MAGNETORESISTANCE; TEMPERATURE DEPENDENCE;

EID: 0036469104 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (42)

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