SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 403-404, Issue , 2002, Pages 30-33

Photoconductivity techniques for defect spectroscopy of photovoltaic materials

(2) Bruggemann R a Kleider, J P b

a UNIVERSITY OF OLDENBURG (Germany)

b SUPELEC (France)

Author keywords

Defects; Photoconductivity; Spectroscopy; Traps

Indexed keywords

AMORPHOUS SILICON; COMPUTER SIMULATION; CRYSTAL DEFECTS; ELECTRON TRAPS; ELECTRONIC DENSITY OF STATES; ENERGY GAP; FERMI LEVEL; PHOTOCONDUCTIVITY; PHOTOVOLTAIC EFFECTS; SPECTROSCOPIC ANALYSIS;

PHOTOVOLATIC MATERIALS;

PHOTOCONDUCTING MATERIALS;

EID: 0036467856 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(01)01571-1 Document Type: Conference Paper

Times cited : (8)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.