Resonant RHEED measurements of surface order on films

Physical Review B - Condensed Matter and Materials Physics

Volumn 57, Issue 7, 1998, Pages 4099-4110

  Bonham, S ^a   Flynn, C ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001766377     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.4099     Document Type: Article

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