The effect of yttrium on the growth process and microstructure of α-Al2O3 on FeCrAl

Oxidation of Metals

Volumn 49, Issue 5-6, 1998, Pages 455-466

  Mennicke, C ^a   Schumann, E ^a   Ruhle M ^a   Hussey, R J ^b   Sproule, G I ^b   Graham, M J ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Alumina scales; FeCrAl; High resolution SIMS; TEM; Y segregation

Indexed keywords

ALUMINA; COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; DIFFUSION IN SOLIDS; DOPING (ADDITIVES); GRAIN BOUNDARIES; GROWTH (MATERIALS); IRON ALLOYS; OXIDATION; SECONDARY ION MASS SPECTROMETRY; SEGREGATION (METALLOGRAPHY); YTTRIUM;

ELECTRON-DISPERSIVE X-RAY SPECTROMETRY (EDS); METAL-OXIDE INTERFACE;

TERNARY SYSTEMS;

EID: 0032092513     PISSN: 0030770X     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1018803113093     Document Type: Article

References (23)

1. F. A. Golightly, F. H. Stott, and G. C. Wood, Oxid. Met. 10, 163 (1976).
2. F. A. Golightly, F. H. Stott, and G. C. Wood, J. Electrochem . Soc. 126, 1035 (1979).
3. H. J. Schmutzler, H. Viefhaus, and H. J. Grabke, Surf. Interface Anal. 18, 581 (1992).
4. P. Y. Hou and J. Stringer, Oxid. Met. 38, 323 (1992).
5. D. R. Sigler, Oxid. Met. 40, 555 (1993).
6. K. Przybylski, A. J. Garratt-Reed, B. A. Pint, E. P. Katz, and G. J. Yurek, J. Electrochem . Soc. 134, 3207 (1987).
7. G. H. Meier, F. S. Pettit, and J. L. Smialek, Mater. Coros. 46, 232 (1995).
8. C. Mennicke, E. Schumann, C. Ulrich, and M. Rühle, Mater. Sci. Forum 251-254, 389 (1997).
9. R. Prescott and M. J. Graham, Oxid. Met. 38, 233 (1992).
10. R. J. Hussey, D. F. Mitchell, and M. J. Graham, Mater. Corros. 38, 575 (1987).
11. J. Jedlinski and G. Borchardt, Oxid. Met. 36, 317 (1991).
12. J. Jedlinski, M. J. Graham, G. I. Sproule, D. F. Mitchell, G. Borchardt, and A. Bernasik, Mater. Corros. 46, 297 (1995).
13. W. J. Quadakkers, H. Holzbrecher, K. G. Briefs, and H. Beske, Oxid. Met. 32, 67 (1989).
14. B. A. Pint, J. R. Martin, and L. W. Hobbs, Oxid. Met. 39, 167 (1993).
15. R. Prescott, D. F. Mitchell, M. J. Graham, and J. Doychak, Corros. Sci. 37, 1341 (1995).
16. R. Prescott, D. F. Mitchell, and M. J. Graham, Proc. 2nd Int. Conf. on Microscopy of Oxidation, S. B. Newcomb and M. J. Bennett, eds. (Institute of Materials, 1993), p. 455.
17. J. Le Coze, private communication.
18. J. Le Coze, R. Tardy, Andre Kobylanski, and M. Biscondi, Proc. 1st. Int. Conf. on Ultra High Purity Base Metals (The Japan Institute of Metals, Japan, 1995), p. 371.
19. A. Strecker, U. Salzberger, and J. Mayer, Prac. Metall. 30, 482 (1993).
20. E. Schumann, J. C. Yang, M. Rühle, and M. J. Graham, Oxid. Met. 46, 37 (1996).
21. B. A. Pint, Oxid. Met. 45, 1 (1996).
22. K. Przybylski and G. J. Yurek, Mater. Sci. Forum 43, 1 (1989).
23. B. Pieraggi and R. A. Rapp, J. Electrochem . Soc. 140, 2844 (1993).