High-resolution SIMS and analytical TEM evaluation of alumina scales on β-NiAl containing Zr or Y

Oxidation of Metals

Volumn 46, Issue 1-2, 1996, Pages 37-49

  Schumann, E ^a   Yang, J C ^a   Ruhle M ^a   Graham, M J ^b  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Alumina scales; Analytical TEM; High resolution SIMS; Zr and Y segregation

Indexed keywords

EID: 0002950373     PISSN: 0030770X     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF01046883     Document Type: Article

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