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Volumn 308-310, Issue , 2001, Pages 738-741

Identification of arsenic antisite defects with EL2 by nanospectroscopic studies of individual centers

Author keywords

As antisite defect; EL2; GaAs; Scanning tunneling microscopy

Indexed keywords

ARSENIC; CRYSTAL GROWTH; ELECTRON TUNNELING; ENERGY GAP; QUENCHING; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0035676751     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(01)00797-9     Document Type: Article
Times cited : (14)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.