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Volumn 308-310, Issue , 2001, Pages 738-741
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Identification of arsenic antisite defects with EL2 by nanospectroscopic studies of individual centers
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Author keywords
As antisite defect; EL2; GaAs; Scanning tunneling microscopy
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Indexed keywords
ARSENIC;
CRYSTAL GROWTH;
ELECTRON TUNNELING;
ENERGY GAP;
QUENCHING;
SCANNING TUNNELING MICROSCOPY;
SEMICONDUCTING GALLIUM ARSENIDE;
METASTABLE STATES;
PHOTOABSORPTION;
POINT DEFECTS;
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EID: 0035676751
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(01)00797-9 Document Type: Article |
Times cited : (14)
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References (17)
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