Influence of defects on current transport in GaN/InGaN multiple quantum well light-emitting diodes

Materials Research Society Symposium - Proceedings

Volumn 722, Issue , 2002, Pages 65-70

  Cao, X A ^a   Stokes, E B ^a   LeBoeuf, S F ^a   Sandvik, P M ^a   Kretchmer, J ^a   Walker, D ^a  

^a GE GLOBAL RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; CRYSTAL DEFECTS; CURRENT DENSITY; ELECTRIC CURRENTS; ELECTRIC PROPERTIES; ELECTRON TRAPS; ELECTRON TUNNELING; HOLE TRAPS; INTERDIFFUSION (SOLIDS); METALLORGANIC CHEMICAL VAPOR DEPOSITION; OPTICAL PROPERTIES; SAPPHIRE; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR QUANTUM WELLS; TRANSPORT PROPERTIES;

FORWARD BIAS;

LIGHT EMITTING DIODES;

EID: 0036458113     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-722-k2.3     Document Type: Conference Paper

References (15)

1. S.D. Lester, F.A. Ponce, M.G. Craford and D.A. Steigerwald, Appl. Phys. Lett. 66, 249 (1995).
2. H.C. Cassey, Jr., J. Muth, S. Krishnankutty and J.M. Zavada, Appl. Phys. Lett. 68, 2867 (1996).
3. P. Perlin, M. Osinski, P.G. Eliseev, V.A. Smagley, J. Mu, M. Banas and P. Sartori, Appl. Phys. Lett. 69, 1680 (1996).
4. I. Martil, E. Redondo and A. Ojeda, J. Appl. Phys. 81, 2442 (1997).
5. A. Chitnis, A. Kurmar, M. Shatalov, V. Adivarahan, A. Lunev, J.W. Yang, G. Simin, M.A. Khan, R. Gaska and M.S. Shur, Appl. Phys. Lett. 77, 3800 (2000).
6. Z. Lillental-Weber, Y. Chen, S. Ruvimov and J. Washburn, Phys. Rev. Lett. 69, 2835 (1997).
7. Y. Chen, T. Takeucki, H. Amano, I. Akasaki, N. Yamada, Y. Kaneko and S.Y. Wang, Appl. Phys. Lett. 72, 710 (1998).
8. D. Chems, S.J. Henley and F.A. Ponce, Appl. Phys. Lett. 78, 2691 (2001).
9. T. Hino, S. Tomiya, T. Miyajima, K. Yanashima, S. Hashimoto and M. Ikeda, Appl. Phys. Lett. 76, 3421 (2000).
10. J. Elsner, R. Jones, M.I. Heggie, P.K. Sitch, M. Haugk, T. Frauenheim, S. Oberg and P.R. Briddon, Phys. Rev. B. 58, 12571 (1998).
11. A.R. Riben and D.L. Feucht, Solid-State Electron. 9, 1055 (1966).
12. S.R. Forrest, M. Didomernico, Jr., R.G. Smith and H.J. Stocker, Appl. Phys. Lett. 36, 580 (1980).
13. J.B. Fedison, T.P. Chow, H. Lu and I.B. Bhat, Appl. Phys. Lett. 72, 2841 (1998).
14. D.J. Dumin and G.L. Pearson, J. Appl. Phys. 36, 3418 (1965).
15. T.N. Morgan, Phys. Rev. 148, 890 (1966).